RF Power Transistor Matching, Testing & Sorting
Due to the stringent system specifications in today’s RF systems, RF Power device performance is critical. In any design that uses multiple RF Power transistors in parallel, using matched devices is the single most important factor in ensuring the design is optimized. There are also cost advantages to receiving product as matched pairs.
Richardson RFPD provides parametric matching (both DC & RF) for all of our RF Power transistors.
Testing & Sorting (Binning) of DC Parameters for Bipolar and FET Devices
Matching Devices: Devices should be matched if being paralleled or used in a push-pull circuit.
Selection of Transistors to Specific Parameter Ranges
Selection of Low Leakage Current Devices
RF Testing (Requires customer's test fixture)
Provide Hard Copy of Test Data Modifications
To learn more about our RF power transistor matching, testing and sorting capabilities, contact your local sales representative.
Semiconductors - Discretes
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